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IRHM9230 - P-Channel Transistor

Key Features

  • s s s s s s s s s s s s Radiation Hardened up to 1 x 105 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Eyelets s Electrically Isolated Absolute Maximum Ratings Parameter I D @ VGS = -12V, TC = 25°C Continuous Drain Current ID @ VGS.

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Datasheet Details

Part number IRHM9230
Manufacturer IRF
File Size 201.26 KB
Description P-Channel Transistor
Datasheet download datasheet IRHM9230 Datasheet

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1395 REPETETIVE AVALANCHE AND dv/dt RATED HEXFET® TRANSISTOR IRHM9230 P-CHANNEL RAD HARD Product Summary Part Number IRHM9230 BVDSS -200V RDS(on) 0.8Ω ID -6.5A -200 Volt, 0.8Ω , RAD HARD HEXFET International Rectifier’s P-Channel RAD HARD technology HEXFETs demonstrate excellent threshold voltage stability and breakdown voltage stability at total radiation doses as high as 105 Rads (Si). Under identical pre- and post-radiation test conditions, International Rectifier’s P-Channel RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose. No compensation in gate drive circuitry is required.