The ’LVT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies.
| Part number | SN74LVT8996 |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 1.42 MB |
| Description | TAP TRANSCEIVERS |
| Datasheet |
 SN74LVT8996 Datasheet
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| Part Number | Description | Manufacturer |
|---|---|---|
| SN74LVC1G125 | high performance non-inverting buffer | UMW |
| SN74LVC1G34 | Single buffer | UMW |
| SN74L71 | AND-Gate R-S Master-Slave F-F | National Semiconductor |
| SN74L74N | Dual D-Type Flip-Flop | ETC |
| SN74LS00 | QUAD 2-INPUT NAND GATE | Motorola |
| Part Number | Description |
|---|---|
| SN74LVT8996-EP | TAP TRANSCEIVERS |
| SN74LVT8980A | EMBEDDED TEST-BUS CONTROLLERS |
| SN74LVT8980A-EP | EMBEDDED TEST-BUS CONTROLLERS |
| SN74LVT8986 | TAP TRANSCEIVERS |
| SN74LVT125 | 3.3-V ABT QUADRUPLE BUS BUFFERS |
The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.
