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IRHN7450 - (IRHN7450 / IRHN8450) HEXFET TRANSISTOR

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Features

  • n n n n n n n n n n n n n n n Radiation Hardened up to 1 x 106 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Electrically Isolated Ceramic Eyelets Surface Mount Light Weight Absolute Maximum Ratings  Parameter ID @ VGS = 12V, TC = 25°C ID.

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Datasheet Details

Part number IRHN7450
Manufacturer International Rectifier
File Size 451.67 KB
Description (IRHN7450 / IRHN8450) HEXFET TRANSISTOR
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www.DataSheet4U.com PD - 90819A REPETITIVE AVALANCHE AND dv/dt RATED HEXFET® TRANSISTOR 500Volt, 0.45Ω , MEGA RAD HARD HEXFET International Rectifier’s RAD HARD technology HEXFETs demonstrate excellent threshold voltage stability and breakdown voltage stability at total radiaition doses as high as 1x106 Rads(Si). Under identical pre- and post-irradiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose. No compensation in gate drive circuitry is required. These devices are also capable of surviving transient ionization pulses as high as 1 x 1012 Rads (Si)/Sec, and return to normal operation within a few microseconds.
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