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SN54ABTH18646A Datasheet, Texas Instruments

SN54ABTH18646A devices equivalent, scan test devices.

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SN54ABTH18646A Datasheet

Application

of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Wideb.

Description

The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan .

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TAGS

SN54ABTH18646A
SCAN
TEST
DEVICES
Texas Instruments

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