SN54ABTH182502A devices equivalent, scan test devices.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Wideb.
The ’ABTH18502A and ’ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to fac.
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