SN54ABTH182504A devices equivalent, scan test devices.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Wideb.
The ’ABTH18504A and ’ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to fa.
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