SN54ABTH182646A devices equivalent, scan test devices.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Wideb.
The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan .
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