The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.
| Part number | SN74LVTH18646A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 885.34 KB |
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Datasheet |
 SN74LVTH18646A Datasheet
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| Part Number | Description |
|---|---|
| SN74LVTH18652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH125 | 3.3-V ABT QUADRUPLE BUS BUFFER |
The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.
