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SN74LVTH182512 - 3.3-V ABT SCAN TEST DEVICES

Download the SN74LVTH182512 datasheet PDF. This datasheet also covers the SN74LVTH18512 variant, as both devices belong to the same 3.3-v abt scan test devices family and are provided as variant models within a single manufacturer datasheet.

General Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (SN74LVTH18512-etcTI.pdf) that lists specifications for multiple related part numbers.

Other Datasheets by Texas Instruments

Part Number Description
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SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES
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SN74LVTH182652A 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18502A 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18504A 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18512 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18646A 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18652A 3.3-V ABT SCAN TEST DEVICES
SN74LVTH125 3.3-V ABT QUADRUPLE BUS BUFFER

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.