The ’LVTH18502A and ’LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
| Part number | SN74LVTH18502A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 829.79 KB |
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Datasheet |
 SN74LVTH18502A Datasheet
|
|
|
| Part Number | Description |
|---|---|
| SN74LVTH18504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH125 | 3.3-V ABT QUADRUPLE BUS BUFFER |
The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.
