Datasheet4U Logo Datasheet4U.com

74AHCT374 - Octal D-type flip-flop

Description

The 74AHC/AHCT374 are high-speed Si-gate CMOS devices and are pin compatible with low power Schottky TTL (LSTTL).

They are specified in compliance with JEDEC standard No.

7A.

Features

  • ESD protection: HBM EIA/JESD22-A114-A exceeds 2000 V MM EIA/JESD22-A115-A exceeds 200 V CDM EIA/JESD22-C101 exceeds 1000 V.
  • Balanced propagation delays.
  • All inputs have Schmitt-trigger actions.
  • Inputs accepts voltages higher than VCC.
  • Common 3-state output enable input.
  • ICC category: MSI.
  • For AHC only: operates with CMOS input levels.
  • For AHCT only: operates with TTL input levels.
  • Specified from.
  • 40 to +85.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
74AHCT374 Octal D-type flip-flop nexperia
74AHCT374-Q100 Octal D-type flip-flop nexperia
74AHCT374D Octal D-type flip-flop nexperia
74AHCT374PW Octal D-type flip-flop nexperia
74AHCT377 Octal D-type flip-flop nexperia

Other Datasheets by NXP Semiconductors

Part Number Description
74AHCT373 Octal D-type transparent latch
74AHCT30 8-input NAND gate
74AHCT32 Quad 2-input OR gate
74AHCT00 Quad 2-input NAND gate
74AHCT02 Quad 2-input NOR gate

Full PDF Text Transcription

Click to expand full text
INTEGRATED CIRCUITS DATA SHEET 74AHC374; 74AHCT374 Octal D-type flip-flop; positive edge-trigger; 3-state Product specification Supersedes data of 1998 Dec 11 File under Integrated Circuits, IC06 1999 Sep 28 Philips Semiconductors Product specification Octal D-type flip-flop; positive edge-trigger; 3-state FEATURES • ESD protection: HBM EIA/JESD22-A114-A exceeds 2000 V MM EIA/JESD22-A115-A exceeds 200 V CDM EIA/JESD22-C101 exceeds 1000 V • Balanced propagation delays • All inputs have Schmitt-trigger actions • Inputs accepts voltages higher than VCC • Common 3-state output enable input • ICC category: MSI • For AHC only: operates with CMOS input levels • For AHCT only: operates with TTL input levels • Specified from −40 to +85 and +125 °C.
Published: |