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CT2N7002E-R3 N-Channel Enhancement MOSFET
Features
• Drain-Source Breakdown Voltage VDSS 60 V • Drain-Source On-Resistance
RDS(ON) 4.15Ω, at VGS= 10V, IDS= 500mA RDS(ON) 4.7Ω, at VGS= 5.0V, IDS= 500mA
℃• Continuous Drain Current at TA=25 ,ID = 500mA
• Advanced high cell density Trench Technology • RoHS Compliance & Halogen Free • ESD protection
Applications
• Cellular phone • Notebook • Power management
Description
The CT2N7002E-R3 is the N-Channel logic enhancement mode power field effect transistors are produced using high cell density, DMOS trench technology. This high density process is especially tailored to minimize on-state resistance.