Datasheet4U Logo Datasheet4U.com

SN74ABT18652 SCAN TEST DEVICE

SN74ABT18652 Description

D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Incl.
This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family.

SN74ABT18652 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Widebus are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments stan

📥 Download Datasheet

Preview of SN74ABT18652 PDF
datasheet Preview Page 2 datasheet Preview Page 3

📁 Related Datasheet

  • SN74101 - AND-OR Gate (ETC)
  • SN74102 - AND Gate (ETC)
  • SN74103 - Dual J-K Flip-Flop (ETC)
  • SN74106 - Dual J-K Flip-Flop (ETC)
  • SN74108 - Dual J-K Flip Flop (ETC)
  • SN7411 - Triple 3-Input AND (ETC)
  • SN74120 - Dual Pulse Synchronizers / Drivers (Texas Instruments Inc)
  • SN74124 - Dual Voltage Controlled Oscillators (ETC)

📌 All Tags

SCAN TEST DEVICE Texas Instruments
Texas Instruments SN74ABT18652-like datasheet