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SN74ABT18646 SCAN TEST DEVICE

SN74ABT18646 Description

D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Incl.
This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family.

SN74ABT18646 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Widebus are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments stan

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