Datasheet Details
| Part number | SCAN182245A | 
|---|---|
| Manufacturer | National Semiconductor | 
| File Size | 205.10 KB | 
| Description | Non-Inverting Transceiver | 
| Datasheet | 
        
           | 
    
		  | Part number | SCAN182245A | 
|---|---|
| Manufacturer | National Semiconductor | 
| File Size | 205.10 KB | 
| Description | Non-Inverting Transceiver | 
| Datasheet | 
        
           | 
    
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals This device is compliant with IEEE 1149 1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI) Test Data Out (TDO) Test Mode Select (TMS) and Test Clock (TCK)
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