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Intersil Electronic Components Datasheet

CD4527BMS Datasheet

CMOS BCD Rate Multiplier

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CD4527BMS
December 1992
CMOS BCD Rate Multiplier
Features
Description
• High Voltage Type (20V Rating)
• Cascadable in Multiples of 4-Bits
• Set to “9” Input and “9” Detect Output
• 100% Tested for Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Maximum Input Current of 1µA at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package/Temperature Range)
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Standardized Symmetrical Output Characteristics
CD4527BMS is a low power 4-bit digital rate multiplier that
provides an output pulse rate which is the clock input pulse
rate multiplied by 1/10 times the BCD input. For example,
when the BCD input is 8, there will be 8 output pulses for
every 10 input pulses. This device may be used to perform
arithmetic operations (add, subtract, divide, raise to a
power), solve algebraic and differential equations, generate
natural logarithms and trigonometric functions, A/D and D/A
conversion, and frequency division.
For fractional multipliers with more than one digit,
CD4527BMS devices may be cascaded in two different
modes: the Add mode and the Multiply mode (see Figures 9
and 11). In the Add mode,
Output Rate =
(Clock Rate) [0.1BCD1 + 0.01BCD2 + 0.001BCD3 + . . .]
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
In the Multiply mode, the fraction programmed into the first
rate multiplier is multiplied by the fraction programmed into
the second one,
Applications
• Numerical Control
• Instrumentation
• Digital Filtering
• Frequency Synthesis
9 4 36
e.g. x = or 36 output
10 10 100
pulses for every 100 clock input pulses.
The CD4527BMS is supplied in these 16-lead outline packages:
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
H4X
H1F
H6W
Pinout
CD4527BMS
TOP VIEW
“9” OUT 1
C2
D3
SET TO “9” 4
OUT 5
OUT 6
INHIBIT OUT (CARRY) 7
VSS 8
16 VDD
15 B
14 A
13 CLEAR
12 CASCADE
11 INHIBIT IN (CARRY)
10 STROBE
9 CLOCK
Functional Diagram
CLOCK
INHIBIT 11
(CARRY) IN
SET TO 4
NINE
13
CLEAR
9
÷10
COUNTER
BCD RATE
SELECT INPUTS
A BC D
14 15 2 3
STROBE
10
12 CASCADE
RATE
SELECT
LOGIC
OUT
6
OUT
5
RATE
OUTPUTS
“9” OUT
1
7 INHIBIT
(CARRY) OUT
VSS = 8
VDD = 16
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-1216
File Number 3343


Intersil Electronic Components Datasheet

CD4527BMS Datasheet

CMOS BCD Rate Multiplier

No Preview Available !

Specifications CD4527BMS
Absolute Maximum Ratings
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC
Package Types D, F, K, H
Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265oC
At Distance 1/16 ± 1/32 Inch (1.59mm ± 0.79mm) from case for
10s Maximum
Reliability Information
Thermal Resistance . . . . . . . . . . . . . . . .
θja
Ceramic DIP and FRIT Package . . . . . 80oC/W
θjc
20oC/W
Flatpack Package . . . . . . . . . . . . . . . . 70oC/W
20oC/W
Maximum Package Power Dissipation (PD) at +125oC
For TA = -55oC to +100oC (Package Type D, F, K) . . . . . . 500mW
For TA = +100oC to +125oC (Package Type D, F, K). . . . . . Derate
Linearity at 12mW/oC to 200mW
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS (NOTE 1)
GROUP A
SUBGROUPS TEMPERATURE
LIMITS
MIN MAX UNITS
Supply Current
IDD VDD = 20V, VIN = VDD or GND
1
+25oC
- 10 µA
2
+125oC
- 1000 µA
VDD = 18V, VIN = VDD or GND
3
-55oC
- 10 µA
Input Leakage Current
IIL VIN = VDD or GND VDD = 20
1
+25oC
-100
-
nA
2
+125oC
-1000 -
nA
VDD = 18V
3
-55oC
-100
-
nA
Input Leakage Current
IIH VIN = VDD or GND VDD = 20
1
+25oC
- 100 nA
2
+125oC
- 1000 nA
VDD = 18V
3
-55oC
- 100 nA
Output Voltage
VOL15 VDD = 15V, No Load
1, 2, 3
+25oC, +125oC, -55oC -
50 mV
Output Voltage
VOH15 VDD = 15V, No Load (Note 3)
1, 2, 3
+25oC, +125oC, -55oC 14.95
-
V
Output Current (Sink)
IOL5 VDD = 5V, VOUT = 0.4V
1
+25oC
0.53 - mA
Output Current (Sink)
IOL10 VDD = 10V, VOUT = 0.5V
1
+25oC
1.4 - mA
Output Current (Sink)
IOL15 VDD = 15V, VOUT = 1.5V
1
+25oC
3.5 - mA
Output Current (Source) IOH5A VDD = 5V, VOUT = 4.6V
1
+25oC
- -0.53 mA
Output Current (Source) IOH5B VDD = 5V, VOUT = 2.5V
1
+25oC
- -1.8 mA
Output Current (Source) IOH10 VDD = 10V, VOUT = 9.5V
1
+25oC
- -1.4 mA
Output Current (Source) IOH15 VDD = 15V, VOUT = 13.5V
1
+25oC
- -3.5 mA
N Threshold Voltage
VNTH VDD = 10V, ISS = -10µA
1
+25oC
-2.8 -0.7 V
P Threshold Voltage
VPTH VSS = 0V, IDD = 10µA
1
+25oC
0.7 2.8
V
Functional
F VDD = 2.8V, VIN = VDD or GND
VDD = 20V, VIN = VDD or GND
7
7
+25oC
+25oC
VOH > VOL < V
VDD/2 VDD/2
VDD = 18V, VIN = VDD or GND
8A
+125oC
VDD = 3V, VIN = VDD or GND
8B
-55oC
Input Voltage Low
(Note 2)
VIL VDD = 5V, VOH > 4.5V, VOL < 0.5V 1, 2, 3 +25oC, +125oC, -55oC -
1.5 V
Input Voltage High
(Note 2)
VIH VDD = 5V, VOH > 4.5V, VOL < 0.5V 1, 2, 3 +25oC, +125oC, -55oC 3.5
-
V
Input Voltage Low
(Note 2)
VIL VDD = 15V, VOH > 13.5V,
VOL < 1.5V
1, 2, 3
+25oC, +125oC, -55oC -
4V
Input Voltage High
(Note 2)
VIH VDD = 15V, VOH > 13.5V,
VOL < 1.5V
1, 2, 3
+25oC, +125oC, -55oC 11
-
V
NOTES: 1. All voltages referenced to device GND, 100% testing being 3. For accuracy, voltage is measured differentially to VDD. Limit
implemented.
is 0.050V max.
2. Go/No Go test with limits applied to inputs.
7-1217


Part Number CD4527BMS
Description CMOS BCD Rate Multiplier
Maker Intersil Corporation
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