n Low RDS(on) n Fast Switching n Single Event Effect (SEE) Hardened n Low Total Gate Charge n Simple Drive Requirements n Ease of Paralleling n Hermetically Sealed n Cer.

These devices have improved immunity to Single Event Effect (SEE) and have been characterized for useful performance wi.

2N7590T3

2N7592T3

2N7594T3

2N7522

2N753

2N7581U2

2N7588T3

2N70

2N70-CA

2N70-CB

2N70-HC

2N70-M

2N700

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