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SN74LVT18512 - 3.3-V ABT SCAN TEST DEVICES

Description

The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Full PDF Text Transcription

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SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 – OCTOBER 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D B-Port Outputs of ’LVT182512 Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required D Compatible With the IEEE Std 1149.
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