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SN74LVC1G02-EP SINGLE 2-INPUT POSITIVE-NOR GATE
SGLS370 – AUGUST 2006
FEATURES
• Controlled Baseline
– One Assembly
– One Test Site
– One Fabrication Site
• Extended Temperature Performance of –55°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree (1)
• Available in the Texas Instruments NanoStar™ and NanoFree™ Packages
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.