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SN54LVTH18652A - 3.3-V ABT SCAN TEST DEVICES

Description

The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.

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SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS312C – MARCH 1994 – REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.
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