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SN54LVTH182646A - 3.3-V ABT SCAN TEST DEVICES

Download the SN54LVTH182646A datasheet PDF. This datasheet also covers the SN54LVTH18646A variant, as both devices belong to the same 3.3-v abt scan test devices family and are provided as variant models within a single manufacturer datasheet.

Description

The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (SN54LVTH18646A-etcTI.pdf) that lists specifications for multiple related part numbers.

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Full PDF Text Transcription

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SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311D – MARCH 1994 – REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.
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