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SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E − JUNE 1990 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and
’BCT374 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin
D SCOPE Instruction Set
− IEEE Standard 1149.
SN54BCT8374A Datasheet
