Click to expand full text
SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E − FEBRUARY 1990 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE™ Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F244 and
’BCT244 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin
D SCOPE™ Instruction Set
− IEEE Standard 1149.
SN54BCT8244A Datasheet
