Datasheet4U Logo Datasheet4U.com

HCTS540MS - Radiation Hardened Inverting Octal Buffer/Line Driver

Description

The Intersil HCTS540MS is a Radiation Hardened inverting Octal Buffer/Line Driver, with two active-low output enables.

The output enable pins (OE1 and OE2) control the threestate outputs.

If either enable is high the outputs will be in the high impedance state.

Features

  • 3 Micron Radiation Hardened CMOS SOS.
  • Total Dose 200K RAD (Si).
  • SEP Effective LET No Upsets: >100 MEV-cm2/mg.
  • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ).
  • Dose Rate Survivability: >1 x.
  • Dose Rate Upset >10 10 1012 RAD (Si)/s RAD (Si)/s 20ns Pulse A3 A4 A5 A6 A7.
  • Latch-Up Free Under Any Conditions.
  • Fanout (Over Temperature Range) - Bus Driver Outputs 15 LSTTL Loads.
  • Military Temperature R.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
HCTS164MS 8-Bit Serial-In/Parallel-Out Shift Register Intersil
HCTS191MS Synchronous 4-Bit Up/Down Counter Intersil
HCTS20MS Radiation Hardened Dual 4-Input NAND Gate Intersil
HCTSM80101AAL High Clearance and Creepage Distance Transformers BOURNS
HCTSM80102AAL High Clearance and Creepage Distance Transformers BOURNS

Other Datasheets by Intersil (Renesas)

Part Number Description
HCTS541MS Radiation Hardened Non-Inverting Octal Buffer/Line Driver
HCTS574MS Radiation Hardened Octal D-Type Flip-Flop
HCTS00MS Radiation Hardened Quad 2-Input NAND Gate
HCTS02MS Radiation Hardened Quad 2-Input NOR Gate
HCTS04MS Radiation Hardened Hex Inverter

Full PDF Text Transcription

Click to expand full text
HCTS540MS September 1995 Radiation Hardened Inverting Octal Buffer/Line Driver, Three-State Pinouts 20 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T20, LEAD FINISH C TOP VIEW OE1 A0 A1 A2 1 2 3 4 5 6 7 8 9 20 VCC 19 OE2 18 Y0 17 Y1 16 Y2 15 Y3 14 Y4 13 Y5 12 Y6 11 Y7 Features • 3 Micron Radiation Hardened CMOS SOS • Total Dose 200K RAD (Si) • SEP Effective LET No Upsets: >100 MEV-cm2/mg • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) • Dose Rate Survivability: >1 x • Dose Rate Upset >10 10 1012 RAD (Si)/s RAD (Si)/s 20ns Pulse A3 A4 A5 A6 A7 • Latch-Up Free Under Any Conditions • Fanout (Over Temperature Range) - Bus Driver Outputs 15 LSTTL Loads • Military Temperature Range: -55oC to +125oC • Significant Power Reduction Compared to LS
Published: |