Datasheet4U Logo Datasheet4U.com

S-57RBNL9S - BIPOLAR HALL EFFECT LATCH

Features

  • Uses a thin (t0.80 mm max. ) TSOT-23-3S or ultra-thin (t0.50 mm max. ) HSNT-6(2025) package, allowing for device miniaturization.
  • Contributes to reduction of mechanism operation dispersion with high-accuracy magnetic characteristics (Typ. value ± 1.0 mT) (Refer to ".
  • Magnetic Characteristics" for details. ).
  • Our production system certifies automotive.

📥 Download Datasheet

Datasheet preview – S-57RBNL9S

Datasheet Details

Part number S-57RBNL9S
Manufacturer ABLIC
File Size 792.46 KB
Description BIPOLAR HALL EFFECT LATCH
Datasheet download datasheet S-57RBNL9S Datasheet
Additional preview pages of the S-57RBNL9S datasheet.

📁 Similar Datasheet

  • S-5711A - HALL-IC (Seiko Instruments)
  • S-5713A - HALL-IC (Seiko)
  • S-5715 - HALL-IC (Seiko)
  • S-5721A - HALL-IC (Seiko Instruments)
  • S-5722A - HALL-IC (Seiko Instruments)
  • S-57A1 - HALL-IC (Seiko Instruments)
  • S-57B1 - HALL-IC (Seiko)
  • S-57K1 - HIGH-SPEED BIPOLAR HALL-EFFECT LATCH (Seiko Instruments)
  • S-57M1 - HIGH-SPEED BIPOLAR HALL-EFFECT LATCH (Seiko)
  • S-57P1 - HIGH-SPEED BIPOLAR HALL-EFFECT LATCH (Seiko Instruments)
Other Datasheets by ABLIC

Full PDF Text Transcription

Click to expand full text
S-57RB S Series www.ablic.com © ABLIC Inc., 2019-2021 AUTOMOTIVE, 150°C OPERATION, HIGH-WITHSTAND VOLTAGE, HIGH-SPEED, BIPOLAR HALL EFFECT LATCH IC Rev.1.4_00 This IC, developed by CMOS technology, is a high-accuracy Hall effect latch IC that operates with high temperature and high-withstand voltage. The output voltage level changes when this IC detects the intensity level of magnetic flux density and a polarity change. Using this IC with a magnet makes it possible to detect the rotation status in various devices. ABLIC Inc. offers a "magnetic simulation service" that provides the ideal combination of magnets and our Hall effect ICs for customer systems. Our magnetic simulation service will reduce prototype production, development period and development costs.
Published: |