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SN74LVTH182512, SN74LVTH18512 - 3.3-V ABT SCAN TEST DEVICES

The SN74LVTH182512 by Texas Instruments is a 3.3-V ABT SCAN TEST DEVICES. Below is the official datasheet preview.

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Official preview page of the SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES datasheet (Texas Instruments).

Datasheet Details

Part number SN74LVTH182512, SN74LVTH18512
Manufacturer Texas Instruments
File Size 683.44 KB
Description 3.3-V ABT SCAN TEST DEVICES
Datasheet download datasheet SN74LVTH18512-etcTI.pdf
Note This datasheet PDF includes multiple part numbers: SN74LVTH182512, SN74LVTH18512.
Please refer to the document for exact specifications by model.
Additional preview pages of the SN74LVTH182512 datasheet.

SN74LVTH182512 Product details

Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

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