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SN54ABT8652 SCAN TEST DEVICES

SN54ABT8652 Description

SN54ABT8652, SN74ABT8652 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS122F * AUGUST 1992 * REVISED DECEMBER 1996 D.
The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit fa.

SN54ABT8652 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas In

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