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SN54ABT8646 SCAN TEST DEVICES

SN54ABT8646 Description

SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F * AUGUST 1992 * REVISED APRIL 2004 D Me.
The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circui.

SN54ABT8646 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments sta

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