SCANSTA101 - Low Voltage IEEE 1149.1 System Test Access Master

Texas Instruments

Datasheet Details

Part number	SCANSTA101
Manufacturer	Texas Instruments
File Size	918.61 KB
Description	Low Voltage IEEE 1149.1 System Test Access Master
Datasheet	SCANSTA101-etcTI.pdf

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system.

1.
2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture.
Supported by Texas Instruments' SCAN Ease (SCAN Embedded.

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Published: Mar 12, 2025 |