SCANSTA101 - Low Voltage IEEE 1149.1 STA Master

National Semiconductor

Datasheet Details

Part number	SCANSTA101
Manufacturer	National Semiconductor
File Size	403.60 KB
Description	Low Voltage IEEE 1149.1 STA Master
Datasheet	SCANSTA101_NationalSemiconductor.pdf

The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system.

of the STA101 further allow it to offload some of the processor overhead while remaining flexible. The device architecture supports IEEE 1149.1, BIST, and IEEE 1532. The flexibility will allow it to adapt to any changes that may occur in 1532 and support yet unknown variants. The SCANSTA101 is useful in improving vector throughput when applying serial vectors to system test circuitry and reduces the software overhead that is associated with applying serial patterns with a parallel processor. The.

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Published: Dec 16, 2005 |