• Part: 74AUP2G38
  • Description: Low-power dual 2-input NAND gate
  • Manufacturer: Nexperia
  • Size: 248.09 KB
Download 74AUP2G38 Datasheet PDF
Nexperia
74AUP2G38
74AUP2G38 is Low-power dual 2-input NAND gate manufactured by Nexperia.
Low-power dual 2-input NAND gate; open drain Rev. 10 - 3 December 2020 Product data sheet 1. General description The 74AUP2G38 provides the dual 2-input NAND gate with open-drain output. The output of the device is an open drain and can be connected to other open-drain outputs to implement active-LOW wired-OR or active-HIGH wired-AND functions. Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall times across the entire VCC range from 0.8 V to 3.6 V. This device ensures a very low static and dynamic power consumption across the entire VCC range from 0.8 V to 3.6 V. This device is fully specified for partial Power-down applications using IOFF. The IOFF circuitry disables the output, preventing a damaging backflow current through the device when it is powered down. 2. Features and benefits - Wide supply voltage range from 0.8 V to 3.6 V - High noise immunity - plies with JEDEC standards: - JESD8-12 (0.8 V to 1.3 V) - JESD8-11 (0.9 V to 1.65 V) - JESD8-7 (1.2 V to 1.95 V) - JESD8-5 (1.8 V to 2.7 V) - JESD8-B (2.7 V to 3.6 V) - ESD protection: - HBM JESD22-A114F Class 3A exceeds 5000 V - MM JESD22-A115-A exceeds 200 V - CDM JESD22-C101E exceeds 1000 V - Low static power consumption; ICC = 0.9 μA (maximum) - Latch-up performance exceeds 100 m A per JESD78B Class II - Inputs accept voltages up to 3.6 V - Low noise overshoot and undershoot < 10 % of VCC - IOFF circuitry provides partial Power-down mode operation - Multiple package options - Specified from -40 °C to +85 °C and -40 °C to +125...