SN54BCT8374A Datasheet, Texas Instruments

of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE is a t.

The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testi.