SN54BCT8373A tester equivalent, scan tester.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE is a t.
The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circu.
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