logo

SN54ABT18640 Datasheet, Texas Instruments

SN54ABT18640 device equivalent, scan test device.

SN54ABT18640 Avg. rating / M : 1.0 rating-12

datasheet Download (Size : 552.32KB)

SN54ABT18640 Datasheet

Application

of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Wideb.

Description

The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of.

Image gallery

SN54ABT18640 Page 1 SN54ABT18640 Page 2 SN54ABT18640 Page 3

TAGS

SN54ABT18640
SCAN
TEST
DEVICE
Texas Instruments

Since 2006. D4U Semicon.   |   Contact Us   |   Privacy Policy   |   Purchase of parts