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SN54ABT18245 - SCAN TEST DEVICE

Description

The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A – AUGUST 1994 – REVISED JANUARY 1995 • Member of the Texas Instruments SCOPE ™ Family of Testability Products • Member of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • SCOPE ™ Instruction Set – IEEE Standard 1149.
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