TP65H070L Datasheet

Features and Benefits

 JEDEC qualified GaN technology
 Dynamic RDS(on)eff production tested
 Robust design, defined by — Intrinsic lifetime tests — Wide gate safety margin — Transient over-voltage capability
 Very low QRR
 Reduced crossover loss
 RoHS compliant and Halogen-free packaging Benefits
 Improves efficie.