HCTS244T
Features
- QML Class T, Per MIL-PRF-38535
- Radiation Performance
- Gamma Dose (γ) 1 x 105 RAD(Si)
- Latch-Up Free Under Any Conditions
- SEP Effective LET No Upsets: >100 MEV-cm2/mg
- Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)
- 3 Micron Radiation Hardened CMOS SOS
- Fanout (Over Temperature Range)
- Bus Driver Outputs
- 15 LSTTL Loads
- Significant Power Reduction pared to LSTTL ICs
- DC Operating Voltage Range: 4.5V to 5.5V
- LSTTL Input patibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
- Input Current Levels Ii ≤ 5m A at VOL, VOH
Specifications
Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers listed below must be used when ordering. Detailed Electrical Specifications for the HCTS244T are contained in SMD 5962-95744. A “hot-link” is provided from our website for downloading. .intersil./spacedefense/newsafclasst.asp Intersil‘s Quality Management Plan (QM Plan), listing all Class T screening...
