* Electrically screened to DLA SMD# 5962-13214
* Acceptance tested to 50krad(Si) (LDR) wafer-by-wafer
* <5µs recovery from SEE (LETTH = 86.4MeV
*cm2/mg)

requiring both high DC accuracy and AC performance. With <5µs recovery for Single Event Transients (SET) (LETTH = 86.4Me.

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