n Low RDS(on) n Fast Switching n Single Event Effect (SEE) Hardened n Low Total Gate Charge n Simple Drive Requirements n Ease of Paralleling n Hermetically Sealed n Cer.

These devices have improved immunity to Single Event Effect (SEE) and have been characterized for useful performance wi.

IRHYB67130CM

IRHYB67134CM

IRHYB597034CM

IRHYB597Z30CM

IRHYB9A97230CM

IRHY3130CM

IRHY3230CM

IRHY4130CM

IRHY4230CM

IRHY53034CM

IRHY53130CM

IRHY53230CM

IRHY53Z30CM

Since 2006. D4U Semicon.   |   Contact Us   |   Privacy Policy   |   Purchase of parts