Part SCANPSC110F
Description SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port
Manufacturer Fairchild Semiconductor
Size 273.25 KB
Fairchild Semiconductor
SCANPSC110F

Overview

The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.