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72-Mbit QDR® II+ SRAM Four-Word Burst Architecture with RadStop™ Technology
Radiation Performance
Radiation Data ■ Total Dose =300 Krad ■ Soft error rate (both Heavy Ion and proton)
Heavy ions 1 × 10-10 upsets/bit-day with an external SECDED EDAC Controller ■ Neutrons = 2.0 × 1014 N/cm2 ■ Dose rate = 2.0 × 109 rad(Si)/sec ■ Dose rate survivability (rad(Si)/sec) = 1.5 × 10^11 (rad(Si)/sec ■ Latch up immunity = 120 MeV.cm2/mg (125 °C)
Prototyping Options ■ Non-qualified CYPT1543AV18, and CYPT1545AV18 devices
with same functional and timing characteristics in a 165-ball Ceramic Column Grid Array (CCGA) package and Land Grid Array (LGA) package without solder columns attached.