Datasheet4U Logo Datasheet4U.com

SN74HC74-EP - DUAL D-TYPE POSITIVE EDGE TRIGGERED FLIP-FLOP

Description

The SN74HC74 device contains two independent D-type positive edge triggered flip-flops.

A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs.

Features

  • 1.
  • Controlled Baseline.
  • One Assembly Site.
  • One Test Site.
  • One Fabrication Site.
  • Extended Temperature Performance of.
  • 55°C to 125°C.
  • Enhanced Diminishing Manufacturing Sources (DMS) Support.
  • Enhanced Product-Change Notification.
  • Qualification Pedigree (1) (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is no.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
SN74HC06 Hex Inverter Lingxing Microelectronics
SN74HC182 FUNCTION LOOK AHEAD CARRY GENERATOR ST Microelectronics
SN74HC423 DUAL RETRIGGERABLE MONOSTABLE MULTIVIBRATOR ST Microelectronics
SN74HCT06 Hex Inverter Lingxing Microelectronics
SN74H74N Dual D-Type Flip-Flop ETC

Other Datasheets by Texas Instruments

Part Number Description
SN74HC74-Q1 DUAL D-TYPE POSITIVE-EDGE-TRIGGERED FLIP-FLOP
SN74HC74 Dual D-Type Positive-Edge-Triggered Flip-Flops
SN74HC74D Dual D-Type Positive-Edge-Triggered Flip-Flops
SN74HC74N Dual D-Type Positive-Edge-Triggered Flip-Flops
SN74HC7001 Quadruple 2-Input AND Gates

Full PDF Text Transcription

Click to expand full text
www.ti.com SN74HC74-EP DUAL D-TYPE POSITIVE EDGE TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET SCLS710 – MARCH 2008 FEATURES 1 • Controlled Baseline – One Assembly Site – One Test Site – One Fabrication Site • Extended Temperature Performance of –55°C to 125°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Published: |