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SN74HC166AĆEP 8ĆBIT PARALLELĆLOAD SHIFT REGISTER
SCLS559 − JANUARY 2004
D Controlled Baseline
− One Assembly/Test Site, One Fabrication Site
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification D Qualification Pedigree† D Wide Operating Voltage Range of 2 V to 6 V D Outputs Can Drive Up To 10 LSTTL Loads D Low Power Consumption, 80-µA Max ICC D Typical tpd = 13 ns
† Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.