Datasheet4U Logo Datasheet4U.com

SN74ACT373-EP - OCTAL D-TYPE TRANSPARENT LATCHES

Description

ordering information This 8-bit latch

Features

  • 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The device is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers. The eight latches are D-type transparent latches. When the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is taken low, the Q outputs are latched at the logic levels set up at the D inputs. A buffered output-enable (OE) input can.

📥 Download Datasheet

Datasheet preview – SN74ACT373-EP

Datasheet Details

Part number SN74ACT373-EP
Manufacturer Texas Instruments
File Size 713.17 KB
Description OCTAL D-TYPE TRANSPARENT LATCHES
Datasheet download datasheet SN74ACT373-EP Datasheet
Additional preview pages of the SN74ACT373-EP datasheet.

📁 Similar Datasheet

  • SN74101 - AND-OR Gate (ETC)
  • SN74102 - AND Gate (ETC)
  • SN74103 - Dual J-K Flip-Flop (ETC)
  • SN74106 - Dual J-K Flip-Flop (ETC)
  • SN74108 - Dual J-K Flip Flop (ETC)
  • SN7411 - Triple 3-Input AND (ETC)
  • SN74120 - Dual Pulse Synchronizers / Drivers (Texas Instruments Inc)
  • SN74124 - Dual Voltage Controlled Oscillators (ETC)
  • SN7415 - Triple 3 Input AND Gate (Motorola)
  • SN74381 - integrated circuits (ETC)
Other Datasheets by Texas Instruments

Full PDF Text Transcription

Click to expand full text
D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D 4.5-V to 5.5-V VCC Operation † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Published: |