Datasheet4U Logo Datasheet4U.com

SN74ACT244-EP - Octal Buffers/Drivers

Description

The SN74ACT244-EP octal buffer/driver is designed specifically to improve the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.

Features

  • Controlled Baseline.
  • One Assembly/Test Site, One Fabrication Site.
  • Extended Temperature Performance of up to.
  • 55°C to 125°C.
  • Enhanced Diminishing Manufacturing Sources (DMS) Support.
  • Enhanced Product-Change Notification.
  • Qualification Pedigree (1).
  • 4.5-V to 5.5-V VCC Operation.
  • Inputs Accept Voltages to 5.5 V.
  • Max tpd of 9.5 ns at 5 V.
  • Inputs Are TTL Compatible (1) Component qualification in accord.

📥 Download Datasheet

Datasheet preview – SN74ACT244-EP

Datasheet Details

Part number SN74ACT244-EP
Manufacturer Texas Instruments
File Size 595.22 KB
Description Octal Buffers/Drivers
Datasheet download datasheet SN74ACT244-EP Datasheet
Additional preview pages of the SN74ACT244-EP datasheet.

📁 Similar Datasheet

  • SN74101 - AND-OR Gate (ETC)
  • SN74102 - AND Gate (ETC)
  • SN74103 - Dual J-K Flip-Flop (ETC)
  • SN74106 - Dual J-K Flip-Flop (ETC)
  • SN74108 - Dual J-K Flip Flop (ETC)
  • SN7411 - Triple 3-Input AND (ETC)
  • SN74120 - Dual Pulse Synchronizers / Drivers (Texas Instruments Inc)
  • SN74124 - Dual Voltage Controlled Oscillators (ETC)
  • SN7415 - Triple 3 Input AND Gate (Motorola)
  • SN74381 - integrated circuits (ETC)
Other Datasheets by Texas Instruments

Full PDF Text Transcription

Click to expand full text
www.ti.com FEATURES • Controlled Baseline – One Assembly/Test Site, One Fabrication Site • Extended Temperature Performance of up to –55°C to 125°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) • 4.5-V to 5.5-V VCC Operation • Inputs Accept Voltages to 5.5 V • Max tpd of 9.5 ns at 5 V • Inputs Are TTL Compatible (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Published: |