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SN54LVTH18512 - 3.3-V ABT SCAN TEST DEVICES

Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Other Datasheets by Texas Instruments

Part Number Description
SN54LVTH18502A 3.3-V ABT SCAN TEST DEVICES
SN54LVTH18504A 3.3-V ABT SCAN TEST DEVICES
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SN54LVTH182512 3.3-V ABT SCAN TEST DEVICES

Full PDF Text Transcription

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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.
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