Datasheet4U Logo Datasheet4U.com

SN54LVT18502 - 3.3-V ABT SCAN TEST DEVICE

Description

The SN54LVT18502 scan test device with 18-bit universal bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
SN54LS00 QUAD 2-INPUT NAND GATE Motorola Inc
SN54LS01 QUAD 2-INPUT NAND GATE Motorola Inc
SN54LS02 QUAD 2-INPUT NOR GATE Motorola Inc
SN54LS03 QUAD 2-INPUT NAND GATE Motorola Inc
SN54LS04 HEX INVERTER Motorola Inc

Other Datasheets by Texas Instruments

Part Number Description
SN54LVT18512 3.3-V ABT SCAN TEST DEVICES
SN54LVT182512 3.3-V ABT SCAN TEST DEVICES
SN54LVT162240 3.3-V ABT 16-BIT BUFFERS/DRIVERS
SN54LVT162244A 3.3-V ABT 16-BIT BUFFERS/DRIVERS
SN54LVT162245A 3.3-V ABT 16-BIT BUS TRANSCEIVERS

Full PDF Text Transcription

Click to expand full text
SN54LVT18502 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS669 – JULY 1996 D Member of the Texas Instruments SCOPE ™ Family of Testability Products D Member of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Supports Unregulated Battery Operation Down to 2.7 V D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.
Published: |