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SCANSTA101 - Low Voltage IEEE 1149.1 System Test Access Master

Description

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system.

It is suitable for use in embedded IEEE 1149.1 applications and as a component in a standalone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100.

Features

  • 1.
  • 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture.
  • Supported by Texas Instruments' SCAN Ease (SCAN Embedded.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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SCANSTA101 www.ti.com SNLS057J – MAY 2002 – REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master Check for Samples: SCANSTA101 FEATURES 1 •2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.
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