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SN74HC165ĆEP 8ĆBIT PARALLELĆLOAD SHIFT REGISTER
D Controlled Baseline
− One Assembly/Test Site, One Fabrication Site
D Extended Temperature Performance of Up
To −55°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification D Qualification Pedigree† D 2-V to 6-V VCC Operation D Outputs Can Drive Up To 10 LSTTL Loads D Low Power Consumption, 80-µA Max ICC D Typical tpd = 13 ns
† Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
HC165EP Datasheet
