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ISPLSI2032VL - 2.5V In-System Programmable SuperFAST High Density PLD

Download the ISPLSI2032VL datasheet PDF. This datasheet also covers the ISP-LSI variant, as both devices belong to the same 2.5v in-system programmable superfast high density pld family and are provided as variant models within a single manufacturer datasheet.

Description

The ispLSI 2032VL is a High Density Programmable Logic Device containing 32 Registers, 32 Universal I/O pins, two Dedicated Input Pins, three Dedicated Clock Input Pins, one dedicated Global OE input pin and a Global Routing Pool (GRP).

Features

  • SuperFAST HIGH.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (ISP-LSI-2032.pdf) that lists specifications for multiple related part numbers.

Datasheet Details

Part number ISPLSI2032VL
Manufacturer Lattice Semiconductor
File Size 156.97 KB
Description 2.5V In-System Programmable SuperFAST High Density PLD
Datasheet download datasheet ISPLSI2032VL Datasheet

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Other Datasheets by Lattice Semiconductor

Part Number Description
ispLSI2032VE 3.3V In-System Programmable High Density SuperFAST PLD
ISPLSI2032 In-System Programmable High Density PLD
ISPLSI2032A In-System Programmable High Density PLD
ispLSI2032E In-System Programmable SuperFAST High Density PLD
ISPLSI2064 In-System Programmable High Density PLD

Full PDF Text Transcription

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ispLSI 2032VL 2.5V In-System Programmable SuperFAST™ High Density PLD Features • SuperFAST HIGH DENSITY IN-SYSTEM PROGRAMMABLE LOGIC — 1000 PLD Gates — 32 I/O Pins, Two Dedicated Inputs — 32 Registers — High Speed Global Interconnect — Wide Input Gating for Fast Counters, State Machines, Address Decoders, etc. — Small Logic Block Size for Random Logic — 100% Functional, JEDEC and Pinout Compatible with ispLSI 2032V and 2032VE Devices • 2.5V LOW VOLTAGE 2032 ARCHITECTURE — Interfaces With Standard 3.3V Devices (Inputs and I/Os are 3.3V Tolerant) — 45 mA Typical Active Current • HIGH PERFORMANCE E2CMOS® TECHNOLOGY — fmax = 180 MHz Maximum Operating Frequency — tpd = 5.
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